AD667

不推荐用于新设计

微处理器兼容型12位DAC

数据手册 (Rev. A) 产品选型表

产品模型: 15

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产品详情

完整的12位数模转换功能
双缓冲锁存器
片内输出放大器
高稳定性嵌入式齐纳基准电压源
单芯片结构
在整个温度范围内保证单调性
在整个温度范围内保证线性度：1/2 LSB（最大值）
建立时间：3 µs（最大值，至0.01%）

保证工作电压：±12 V或±15 V
低功耗：300 mW（包括基准电压源）
TTL/5 V CMOS兼容逻辑输入
低逻辑输入电流
提供符合MIL-STD-883标准的版本

参考资料

数据手册 2

AD667: Microprocessor-Compatible 12-Bit D/A Converter Data Sheet (Rev.A) 05/15/2009

AD667 Military Data Sheet (Rev.0) 05/15/2009
- AD667: Standard Military Drawing (Rev B, 2/2002)

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
5962-88659013A	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
5962-8865901XA	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667AD	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667BD	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667JCHIPS	none available	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667JNZ	28-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667JPZ	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667JPZ-REEL	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667KNZ	28-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667KPZ	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667KPZ-REEL	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667SD	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667SD/883B	28-Lead CerDIP (Side Brazed)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667SE	28-Lead LCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD667SE/883B	28-Lead LCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys

产品型号	产品生命周期	PCN

4月 9, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
5962-88659013A
5962-8865901XA
AD667SD/883B
AD667SE/883B
6月 6, 2012 - 12_0066 Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
		PCN12_0066_Form Material_Report Qualification Report Summary
5962-88659013A
5962-8865901XA
AD667AD	量产
AD667SD	量产
AD667SD/883B
AD667SE
AD667SE/883B
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
5962-88659013A
5962-8865901XA
AD667AD	量产
AD667BD	量产
AD667SD	量产
AD667SD/883B
AD667SE
AD667SE/883B
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
5962-88659013A
5962-8865901XA
AD667AD	量产
AD667BD	量产
AD667JNZ	量产
AD667JPZ	量产
AD667JPZ-REEL	量产
AD667KNZ	量产
AD667KPZ	量产
AD667KPZ-REEL	量产
AD667SD	量产
AD667SD/883B
AD667SE
AD667SE/883B
3月 7, 2019 - 19_0046 Assembly Transfer of 18,20,24,28 Lead PDIP to Cirtek
		PCN19_0046_Form Material_Report Detailed Change Description Qualification Results Summary
AD667JNZ	量产
AD667KNZ	量产
8月 19, 2009 - 07_0024 Package Material Changes for SOT23, MiniSO, MQFP, PDIP, PLCC, SOIC (narrow and wide body), SSOP, TSSOP and TSSOP exposed pad
		Material_Report Material_Report Parts List PCN07_0024_Form Qual Data
AD667JNZ	量产
AD667KNZ	量产

这是最新版本的数据手册

硬件生态系统

部分模型	产品周期	描述
AD5530	量产	串行输入、电压输出12位DAC
AD5531	量产	串行输入、电压输出14位DAC

工具及仿真模型

精密DAC误差预算工具

精密DAC误差预算工具是一种Web应用程序，用于计算精密DAC信号链的直流精度。它可显示整个信号链中的静态误差状况，以快速评估设计利弊。可计算由基准电压源、运算放大器和精密DAC引起的直流误差。

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