AD7547

不推荐用于新设计

双通道12位CMOS DAC，采用并行加载输入结构

数据手册 (Rev. A) 产品选型表

产品模型: 13

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产品详情

一个封装中集成两个12位DAC
DAC梯形电阻匹配：0.5%
超小型DIP和表面贴装封装，节省空间

四象限乘法
低增益误差（整个温度范围内最大值为1 LSB）
快速接口定时

参考资料

数据手册 2

AD7547: Dual 12-Bit CMOS DAC with Parallel Load Input Structure Data Sheet (Rev.A) 09/26/1986

AD7547: Military Data Sheet 01/01/2000

应用笔记 7

AN-348: 避开无源元件的陷阱 08/16/2013

AN-912: Driving a Center-Tapped Transformer with a Balanced Current-Output DAC 08/07/2023

AN-225: 12-Bit Voltage-Output DACs for Single-Supply 5V and 12V Systems 01/01/2000

AN-209: 8th Order Programmable Low-Pass Analog Filter Using Dual 12-Bit CMOS Multiplying DACs 01/01/2000

AN-137: A Digitally Programmable Gain and Attenuation Amplifier Design 09/26/2002

AN-206: CMOS Multiplying DAC Based Panning Circuit Provides Almost Constant Output Power 01/01/2000

AN-320A: CMOS Multiplying DACs and Op Amps Combine to Build Programmable Gain Amplifier, Part 1 10/15/2004

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
5962-89657023A	28 ld LCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547ACHIPS	none available	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547JNZ	24-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547JPZ	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547JPZ-REEL	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547JRZ	24-Lead SOIC (Wide)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547JRZ-REEL	24-Lead SOIC (Wide)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547KNZ	24-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547KPZ	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547LNZ	24-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547LPZ-REEL	28-Lead PLCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547LRZ	24-Lead SOIC (Wide)	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7547LRZ-REEL	24-Lead SOIC (Wide)	Material Declaration Reliablity Data	Ultra Librarian SamacSys

产品型号	产品生命周期	PCN

4月 9, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
5962-89657023A
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
5962-89657023A		PCN11_0050_Form Material_Report
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
5962-89657023A		PCN11_0182_Form Material_Report
2月 8, 2010 - 04_0080 Qualification of the 8" C6 and Q Wafer Fab Processes at Analog Devices, Limerick, Ireland.
		PCN04_0080_Form Material_Report Reliability Report Reliability Report
5962-89657023A
AD7547ACHIPS
AD7547JNZ	量产
AD7547JPZ	量产
AD7547JRZ	量产
AD7547KNZ	量产
AD7547KPZ	量产
AD7547LNZ	量产
AD7547LRZ	量产
2月 1, 2010 - 10_0020 Test Solutions Services, Inc.(TSSI) as Subcontractor Burn-in Facility.
		Material_Report PCN10_0020_Form Qual Plan
5962-89657023A		Material_Report PCN10_0020_Form Qual Plan
3月 7, 2019 - 19_0046 Assembly Transfer of 18,20,24,28 Lead PDIP to Cirtek
		PCN19_0046_Form Material_Report Detailed Change Description Qualification Results Summary
AD7547JNZ	量产
AD7547KNZ	量产
AD7547LNZ	量产
8月 19, 2009 - 07_0024 Package Material Changes for SOT23, MiniSO, MQFP, PDIP, PLCC, SOIC (narrow and wide body), SSOP, TSSOP and TSSOP exposed pad
		Material_Report Material_Report Parts List PCN07_0024_Form Qual Data
AD7547JNZ	量产
AD7547KNZ	量产
AD7547LNZ	量产
2月 7, 2011 - 10_0003 Halogen Free Material Change for SOIC Wide Body Products Assembled at Amkor
		PCN10_0003_Form Material_Report Qualification Plan Summary
AD7547JRZ	量产
AD7547JRZ-REEL	量产
AD7547LRZ	量产
AD7547LRZ-REEL	量产

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精密DAC误差预算工具

精密DAC误差预算工具是一种Web应用程序，用于计算精密DAC信号链的直流精度。它可显示整个信号链中的静态误差状况，以快速评估设计利弊。可计算由基准电压源、运算放大器和精密DAC引起的直流误差。

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