AD7543

不推荐用于新设计

12-Bit, Multiplying I_OUT, SERIAL

数据手册 (Rev. B) 产品选型表

产品模型: 9

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产品详情

分辨率：12bit
非线性：在T_min～T_max范围内, ±1/2 LSB
低增益漂移：2ppm/°C 典型值，5ppm/°C最大值
正或负选通引脚支持串联负载
异步清零输入用于初始化
完整的4象限乘法

低乘法馈通：10 KHz下1 LSB最大值
无需肖特基二极管输出
保护
低功耗：40 mW最大值
5 V电源电压
采用16引脚DIP
和20引脚SMP小型封装
低成本

参考资料

数据手册 1

AD7543: CMOS Serial Input 12-Bit DAC Scanned Data Sheet (Rev.B) 09/30/1980

应用笔记 1

AN-225: 12-Bit Voltage-Output DACs for Single-Supply 5V and 12V Systems 01/01/2000

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
AD7543GKNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543GTQ/883B	16 ld CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543JNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543KNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543KPZ	20-Lead Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543KRZ	16-Lead SOIC Wide	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543KRZ-REEL	16-Lead SOIC Wide	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543SQ/883B	16 ld CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7543TE/883B	20 ld LCC	Material Declaration Reliablity Data	Ultra Librarian SamacSys

产品型号	产品生命周期	PCN

3月 29, 2021 - 21_0033 Assembly Site Transfer for 14/16L 300_MIL PDIP to Cirtek
		PCN21_0033_Form Material_Report Detailed Change Description Qualification Results Summary
AD7543GKNZ	量产
AD7543JNZ	量产
8月 19, 2009 - 07_0024 Package Material Changes for SOT23, MiniSO, MQFP, PDIP, PLCC, SOIC (narrow and wide body), SSOP, TSSOP and TSSOP exposed pad
		Material_Report Material_Report Parts List PCN07_0024_Form Qual Data
AD7543GKNZ	量产
AD7543JNZ	量产
AD7543KNZ	量产
4月 9, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
AD7543GTQ/883B
AD7543SQ/883B
AD7543TE/883B
11月 7, 2012 - 12_0199 Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
		PCN12_0199_Form Material_Report Qualification Report Summary Datasheet Specification Comparison
AD7543GTQ/883B
AD7543SQ/883B
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
AD7543GTQ/883B
AD7543SQ/883B
AD7543TE/883B
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
AD7543GTQ/883B
AD7543SQ/883B
AD7543TE/883B
2月 8, 2010 - 04_0080 Qualification of the 8" C6 and Q Wafer Fab Processes at Analog Devices, Limerick, Ireland.
		PCN04_0080_Form Material_Report Reliability Report Reliability Report
AD7543GTQ/883B
AD7543JNZ	量产
AD7543KNZ	量产
AD7543KRZ	量产
AD7543SQ/883B
AD7543TE/883B
8月 4, 2010 - 10_0117 Halogen Free Material Change for SOIC_W Products at Carsem
		PCN10_0117_Form Material_Report Reliability Report
AD7543KRZ	量产
AD7543KRZ-REEL	量产
2月 1, 2010 - 10_0020 Test Solutions Services, Inc.(TSSI) as Subcontractor Burn-in Facility.
		Material_Report PCN10_0020_Form Qual Plan
AD7543TE/883B		Material_Report PCN10_0020_Form Qual Plan

这是最新版本的数据手册

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精密DAC误差预算工具

精密DAC误差预算工具是一种Web应用程序，用于计算精密DAC信号链的直流精度。它可显示整个信号链中的静态误差状况，以快速评估设计利弊。可计算由基准电压源、运算放大器和精密DAC引起的直流误差。

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