AD7533

不推荐用于新设计

CMOS、低成本、10位乘法DAC

数据手册 (Rev. C) 产品选型表

产品模型: 13

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产品详情

低成本10位DAC
AD7520的低成本替代器件
线性度：½ LSB、1 LSB或2 LSB
低功耗

完全四象限乘法DAC
CMOS/TTL直接接口
无闩锁现象（无需肖特基二极管保护）
端点线性度

产品模型: 13

参考资料

数据手册 1

AD7533: CMOS Low Cost, 10-Bit Multiplying DAC Data Sheet (Rev.C) 08/01/1978

应用笔记 3

AN-912: Driving a Center-Tapped Transformer with a Balanced Current-Output DAC 08/07/2023

AN-320A: CMOS Multiplying DACs and Op Amps Combine to Build Programmable Gain Amplifier, Part 1 10/15/2004

AN-137: A Digitally Programmable Gain and Attenuation Amplifier Design 09/26/2002

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
AD7533ACHIPS	none available	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533CQ	16-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533JNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533JPZ	20-Lead Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533KNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533KPZ	20-Lead Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533KPZ-REEL	20-Lead Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533KRZ	16-Lead SOIC Wide	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533KRZ-REEL	16-Lead SOIC Wide	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533LNZ	16-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533SQ	16-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533UQ	16-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD7533UQ/883B	16-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys

产品型号	产品生命周期	PCN

2月 8, 2010 - 04_0080 Qualification of the 8" C6 and Q Wafer Fab Processes at Analog Devices, Limerick, Ireland.
		PCN04_0080_Form Material_Report Reliability Report Reliability Report
AD7533ACHIPS
AD7533CQ
AD7533JNZ	量产
AD7533JPZ	量产
AD7533KNZ	量产
AD7533KPZ	量产
AD7533KPZ-REEL	量产
AD7533KRZ	量产
AD7533KRZ-REEL	量产
AD7533LNZ	量产
AD7533SQ
AD7533UQ
AD7533UQ/883B
11月 7, 2012 - 12_0199 Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
		PCN12_0199_Form Material_Report Qualification Report Summary Datasheet Specification Comparison
AD7533CQ
AD7533SQ
AD7533UQ
AD7533UQ/883B
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
AD7533CQ
AD7533SQ
AD7533UQ
AD7533UQ/883B
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
AD7533CQ
AD7533SQ
AD7533UQ
AD7533UQ/883B
3月 29, 2021 - 21_0033 Assembly Site Transfer for 14/16L 300_MIL PDIP to Cirtek
		PCN21_0033_Form Material_Report Detailed Change Description Qualification Results Summary
AD7533JNZ	量产
AD7533KNZ	量产
AD7533LNZ	量产
8月 19, 2009 - 07_0024 Package Material Changes for SOT23, MiniSO, MQFP, PDIP, PLCC, SOIC (narrow and wide body), SSOP, TSSOP and TSSOP exposed pad
		Material_Report Material_Report Parts List PCN07_0024_Form Qual Data
AD7533JNZ	量产
AD7533KNZ	量产
AD7533LNZ	量产
8月 4, 2010 - 10_0117 Halogen Free Material Change for SOIC_W Products at Carsem
		PCN10_0117_Form Material_Report Reliability Report
AD7533KRZ	量产
AD7533KRZ-REEL	量产
4月 9, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
AD7533UQ/883B
8月 16, 2019 - 12_0068 Discontinuance of 6 chip models
		PDN12_0068_Form Material_Report
AD7533ACHIPS		PDN12_0068_Form Material_Report