Designers of automatic test equipment (ATE) systems for advanced components have always had a dilemma: in order to test the newest, fastest, most precise products, they themselves need components that are even better than they are testing. The unique design constraints of ATE add to the difficulties of assembling a system for testing high-speed, high-pin-count devices. Read full article
High-speed Automatic Testing for Advanced Components
Pin Drivers, Comparators, DACs, and Active Loads Have Key Roles; Size, Speed, Accuracy, and Repeatability are Constraints
著者
