ADL5309
RECOMMENDED FOR NEW DESIGNSDual, 188 dB Range, 10 pA to 25 mA, Logarithmic Converter
- Part Models
- 3
- 1ku List Price
- Starting From $16.91
Part Details
- 188 dB electrical dynamic range and 94 dB optical dynamic range
- Dual-channel current inputs for direct optical gain measurements
- Accurately trimmed logarithmic response:
- Logarithmic slope 200 mV/decade
- Logarithmic conformance error ±0.4 dB over temperature
- Offset trimmed at 70°C to reduce dark current
- Integrated LDO: 26 dB PSRR at 60 Hz and 100 pA input current (VCC = 3.0 V)
- I2C adjustable:
- Photodiode bias voltage
- Trade-off between noise and response time at low input currents
- Integrated 14-bit ADC
- Requires minimal external components
- 2.040 mm × 1.640 mm, 20-lead WLCSP
The ADL5309 contains dual monolithic logarithmic transimpedance amplifiers that are optimized for measuring low-frequency and wide dynamic range optical signal power in fiber optic systems.
The device produces highly accurate, temperature compensated output voltages that are proportional to the logarithm of the ratio between the input current at the INP1 and INP2 pins and the internally generated reference currents. The logarithmic slope and intercept are both accurately trimmed to a nominal value of 200 mV/decade and 10 pA, respectively. The low-impedance OUT1 and OUT2 logarithmic outputs have the capability to drive a wide range of analog-to-digital converters (ADCs) and other circuits.
A digital representation of the OUT1 and OUT2 outputs is available through the inter-IC bus (I2C) interface. A 14-bit successive approximation register (SAR) ADC, controlled through the I2C interface, samples the OUT1 and OUT2 channel outputs along with a built-in digital temperature sensor.
Adaptive photodiode biasing is supported through the PDB1 and PDB2 interfaces. At low diode currents, the photodiode reverse bias is kept small to minimize the dark current. At higher input currents, the bias voltage scales linearly with the current to avoid nonlinearity due to photodiode saturation. Both the starting bias level and the scale factor at higher currents are configurable through I2C.
The ADL5309 is specified for operation from −40°C to +105°C ambient temperature and is offered in a small 2.040 mm × 1.640 mm, 20-lead wafer level chip scale package (WLCSP).
APPLICATIONS
- Automatic test equipment
- Optical power monitoring
- Machine automation
- Optical modules
Documentation
Data Sheet 1
User Guide 1
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal. View our quality and reliability program and certifications for more information.
Part Model | Pin/Package Drawing | Documentation | CAD Symbols, Footprints, and 3D Models |
---|---|---|---|
ADL5309ACBZ | CHIPS W/SOLDER BUMPS/WLCSP | ||
ADL5309ACBZ-R7 | CHIPS W/SOLDER BUMPS/WLCSP | ||
ADL5309ACBZ-RL | CHIPS W/SOLDER BUMPS/WLCSP |
This is the most up-to-date revision of the Data Sheet.
Hardware Ecosystem
Parts | Product Life Cycle | Description |
---|---|---|
LDO Plus 1 | ||
LT3042 | RECOMMENDED FOR NEW DESIGNS | 20V, 200mA, Ultralow Noise, Ultrahigh PSRR RF Linear Regulator |
Positive Linear Regulators (LDO) 2 | ||
ADP7118 | RECOMMENDED FOR NEW DESIGNS | 20 V, 200 mA, Low Noise, CMOS LDO Linear Regulator |
ADP7112 | RECOMMENDED FOR NEW DESIGNS | 20 V, 200 mA, Low Noise, CMOS LDO Linear Regulator |
Evaluation Kits
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