ADG1401

• Designed to cover full Tx signal chains with integrated MCU and user-friendly GUI for faster and easier integration
• Supports fault event protection - overvoltage (OV), overcurrent (OC), and overtemperature (OT)
• Supports ultrafast sub-µs GaN gate voltage switching ~ (<1 µs)
• Supports ultrafast (<10 µs) fault event protection from detection up to GaN gate pinch-off
• Wide range of gate bias voltages from -10 V to +10 V
• Configurable power-up and power-down sequence

The AD-PAARRAY3552R-SL reference design provides control, protection, and proper biasing sequence for GaN power amplifier (PA) arrays. The design incorporates the AD3553R high-speed, dual-channel, 16-bit DAC to support the ultrafast sub-µs voltage settling time of GaN gates.

Key fault events, including overvoltage, overcurrent, and overtemperature, are effectively managed by the LTC7000, a static switch driver responsible for system fault protection.

The on-board MAX32666 ultralow-power ARM^® Cortex^®-M4 microprocessor provides essential debug and programming features for a comprehensive software development experience with the system. The system's firmware is built on ADI's open-source no-OS framework and includes a user-friendly graphical interface (GUI) for evaluation. Updates are easily applied through an SWD UART bootloader, streamlining prototyping.

The system can be powered by an external +48 V supply, requiring high current capabilities.

APPLICATIONS

• 5G massive MIMOs
• Macro base stations

• 8引脚MSOP评估板
• 利用夹子，可轻松更换主器件
• 利用金引脚连接器，可添加无源元件
• SMB连接器用于信号输入/输出
• 板上具有额外空间，便于原型开发

EVAL-8MSOPEBZ是一款用于须单独购买的开关/多路复用产品组合中8引脚MSOP器件的评估板。 该评估板自带夹子，这样器件可固定到该板上，而无需焊接。 这使得该评估板可重复用于多个器件。

该器件可固定或焊接到评估板的中心。 将器件的各引脚连接至可设置为VDD或GND的链路，并采用接线螺丝端子提供VDD和GND。 该板上具有SMB连接器，从而向器件提供额外的外部信号。 此外，板顶部具有空间用于原型开发。

该产品数据手册提供该测试器件的完整规格，使用评估板时应同时参考用户指南与数据手册。