DS2174
EBERT
Part Details
- Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
- Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path
- Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
- Large 48-bit count and bit error count registers
- Software-programmable bit error insertion
- Fully independent transmit and receive paths
- 8-bit parallel-control port
- Detects polynomial test patterns in the presence of bit error rates up to 10-2
- Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
- Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
- Available in 44-pin PLCC
The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.
Documentation
Data Sheet 1
Reliability Data 1
Design Note 1
This is the most up-to-date revision of the Data Sheet.
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