DS2172
Bit Error Rate Tester (BERT)
Part Details
- Generates/detects digital bit patterns for analyzing, evaluating, and troubleshooting digital communications systems
- Operates at speeds from DC to 52MHz
- Programmable polynomial length and feedback taps for generation of any other pseudorandom pattern up to 32 bits in length including: 26-1, 29-1, 211-1, 215-1, 220-1, 223-1, and 232-1
- Programmable user-defined pattern and length for generation of any repetitive pattern up to 32 bits in length
- Large 32-bit error count and bit count registers
- Software-programmable bit-error insertion
- Fully independent transmit and receive sections
- 8-bit parallel control port
- Detects test patterns with bit error rates up to 10-2
The DS2172 Bit Error Rate Tester (BERT) is a software-programmable test pattern generator, receiver, and analyzer capable of meeting the most stringent error performance requirements of digital transmission facilities. Two categories of test pattern generation (pseudorandom and repetitive) conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS2172 operates at clock rates ranging from DC to 52MHz. This wide range of operating frequency allows the DS2172 to be used in existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs, routers, bridges, CSUs, DSUs, and CPE equipment.
The DS2172 user-programmable pattern registers provide the unique ability to generate loopback patterns required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence, the DS2172 can initiate the loopback, run the test, check for errors, and finally deactivate the loopback.
The DS2172 consists of four functional blocks: the pattern generator, pattern detector, error counter, and control interface. The DS2172 can be programmed to generate any pseudorandom pattern with length up to 232-1 bits (see table 5, note 9 in data sheet) or any user-programmable bit pattern from 1 to 32 bits in length. Logic inputs can be used to configure the DS2172 for applications requiring gap clocking such as Fractional-T1, Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the DS2172 can insert single or 10-1 to 10-7 bit errors to verify equipment operation and connectivity.
Documentation
Data Sheet 1
Reliability Data 1
Design Note 5
Technical Articles 1
This is the most up-to-date revision of the Data Sheet.
Tools & Simulations
IBIS Model 1
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