ADR130

• 低失真、高分辨率源
  • DC至40kHz
  • 专有数字预失真(DPD)算法
  • –130dBc THD（1kHz，典型值）
  • 集成片上模式存储器的任意波形发生器(AWG)
  • 差分（平衡）输出高达3.6VRMS
• 多个存储波形之间的快速模式切换
• 小尺寸(60mm x 40mm)
• 低功耗、1W（典型值、静态）
• 用于集成到测试与测量系统中的SPI接口

ADMX1002是一款低失真正弦波和高分辨率任意波形发生器。此高性能模块展示了专有数字预失真算法，该算法将信号失真降低至可通过高性能数模转换器(DAC)和放大器实现的水平。其差分输出可设置为测试高性能模数转换器(ADC)、音频编解码器和其他音频IC和系统通常所需的共模电平。ADMX1002具有易于使用的SPI接口和小尺寸，可轻松嵌入到测试系统，或用于工作台进行测量和特性表征。

应用

• 高端音频测试
• 模数转换器特性表征和测试
• 传感器测试
• 频率响应和网络分析
• ATE

• Ultra-low distortion, high-resolution source
  • DC, 50Hz to 40kHz Frequency Range
  • Proprietary digital pre-distortion (DPD) algorithm
  • –130dBc THD @ 1kHz (typ.)
  • Arbitrary waveform generation (AWG) with on-board pattern memory
  • Differential (balanced) output up to 3.5VRMS
  • Fast pattern switching between multiple stored waveforms
• Fully Differential input Acquisition Channel
• Small form-factor (60mm x 40mm)
• Low power, 1W typ. (quiescent)
• SPI interface for integration into test and measurement systems

The ADMX1001 is an ultra-low distortion sinewave and high-resolution arbitrary waveform generator with an acquisition channel. This high-performance module demonstrates a proprietary digital pre-distortion algorithm that reduces signal distortion below levels that can be achieved with high-performance digital-to-analog converters (DAC) and amplifiers alone. Its differential output can be set to common-mode levels often required to test high-performance analog-to-digital converters (ADC), audio codecs, and other audio ICs and systems. The signal generator and the acquisition channel can be individually controlled using separate, easy to use, SPI interfaces - combined with the module's small-form factor, the ADMX1001 can be easily embedded into test systems, or simply used on the bench for measurement and characterization.

APPLICATIONS

• High-end audio test
• Analog-to-digital converter characterization and test
• Sensor and transducer test
• Frequency response and network analysis
• ATE